Journals

  • Home
  • Publication
  • Journals
First Demonstration of Ultra-Thin SiGe-Channel Junctionless Accumulation-Mode (JAM) Bulk FinFETs on Si Substrate with PN Junction-Isolation Scheme
Journal
IEEE J. Electron Devices Soc.
Author
Dong-Hyun Kim, Tae Kyun Kim, Young Gwang Yoon, Byeong-Woon Hwang, Yang-Kyu Choi, Byung Jin Cho, and Seok-Hee Lee
Year
2014
Date
Sep. 2014.

Dong-Hyun Kim, Tae Kyun Kim, Young Gwang Yoon, Byeong-Woon Hwang, Yang-Kyu Choi, Byung Jin Cho, and Seok-Hee Lee, "First Demonstration of Ultra-Thin SiGe-Channel Junctionless Accumulation-Mode (JAM) Bulk FinFETs on Si Substrate with PN Junction-Isolation Scheme", IEEE J. Electron Devices Soc., vol. 2, no. 5, pp. 123-127, Sep. 2014.