Carbon Doped Polysilicon Floating Gate for Improved Data Retention and P/E Window of Flash Memory
- Journal
- IEEE Electron Device Lett.
- Year
- 2008
J. Pu, S. J. Kim, S. H. Lee, Y. S. Kim, S. T. Kim, K. J. Choi and B. J. Cho, "Carbon Doped Polysilicon Floating Gate for Improved Data Retention and P/E Window of Flash Memory ", IEEE Electron Device Lett., vol. 29, no. 7, pp. 688-690, Jul. 2008.
