Boron profile narrowing in laser processed silicon after rapid thermal anneal
- Journal
- J. Electrochem. Soc.
- Year
- 2004
C. H. Poon, L. S. Tan, B. J. Cho, A. See, and M. Bhat, "Boron profile narrowing in laser processed silicon after rapid thermal anneal," J. Electrochem. Soc., vol. 151, no. 1, pp. G80-G83, Jan. 2004.
