Highly Reliable Charge Trap-Type Organic Non-Volatile Memory Device Using Advanced Band-Engineered Organic-Inorganic Hybrid Dielectric Stacks
- Journal
- Advanced Functional Materials
- Vol
- 31 (41)
- Page
- 2103291. 1-2103291. 9
- Year
- 2021
Min Ju Kim, Changhyeon Lee, Eui Joong Shin, Tae In Lee, Seongho Kim, Jaejoong Jeong, Junhwan Choi, Wan Sik Hwang, Sung Gap Im, and Byung Jin Cho, "Highly Reliable Charge Trap-Type Organic Non-Volatile Memory Device Using Advanced Band-Engineered Organic-Inorganic Hybrid Dielectric Stacks", Advanced Functional Materials, vol. 31, no. 41, pp. 2103291. 1-2103291. 9, Jul. 2021.