Influence of self-heating on interface trap generation in highly flexible single crystalline Si nanomembrane transistors
- Journal
- Journal of Nanoscience and Nanotechnology
- Vol
- 19 (10)
- Page
- 6481-6486
- Year
- 2019
Jae Hoon Bong, Seung-Yoon Kim, Chan Bae Jeong, KiSooChan, Wan Sik Hwang, and Byung Jin Cho, "Influence of self-heating on interface trap generation in highly flexible single crystalline Si nanomembrane transistors", Journal of Nanoscience and Nanotechnology, vol. 19, no. 10, pp. 6481-6486, Oct. 2019.