Mechanical and Electrical Reliability Analysis of Flexible Si Complementary Metal-Oxide-Semiconductor Integrated Circuit
- Journal
- Journal of Nanoscience and Nanotechnology
- Vol
- 19 (10)
- Page
- 6473-6480
- Year
- 2019
Seungyoon Kim, Cheolgyu Kim, Jae Hoon Bong, Wan Sik Hwang, Taek-Soo Kim, Jae Sub Oh, and Byung Jin Cho, "Mechanical and Electrical Reliability Analysis of Flexible Si Complementary Metal-Oxide-Semiconductor Integrated Circuit", Journal of Nanoscience and Nanotechnology , vol. 19, no. 10, pp. 6473-6480, Oct. 2019.