Performance Degradation of Flexible Si Nanomembrane Transistors With Al2O3and SiO2Dielectrics Under Mechanical Stress
- Journal
- IEEE Transactions of Electron Devices
- Vol
- 65 (7)
- Page
- 3069-3072
- Year
- 2018
Seung-Yoon Kim, Jae Hoon Bong, Dong Jun Kim, Choong Sun Kim, Hyeongdo Choi, Wan Sik Hwang, and Byung Jin Cho, "Performance Degradation of Flexible Si Nanomembrane Transistors With Al2O3and SiO2Dielectrics Under Mechanical Stress", IEEE Transactions of Electron Devices, vol. 65, no. 7, pp. 3069-3072, Jul. 2018.