Reliability Improvement of a Flexible FD-SOI MOSFET via Heat Management
- Journal
- Applied Physics Letters
- Year
- 2017
Jae Hoon Bong, Seung-Yoon Kim, Chan Bae Jeong, Ki Soo Chang, Wan Sik Hwang and Byung Jin Cho, "Reliability Improvement of a Flexible FD-SOI MOSFET via Heat Management", Applied Physics Letters, June. 2017. 110, 252101
