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Effect of substrate hot-carrier injection on quasi-breakdown of ultra-thin gate oxide
Journal
J. Appl. Phys.
Author
B. J. Cho, Z. Xu, H. Guan, and M. F. Li
Year
1999
Date
Dec. 1999.

B. J. Cho, Z. Xu, H. Guan, and M. F. Li, "Effect of substrate hot-carrier injection on quasi-breakdown of ultra-thin gate oxide", J. Appl. Phys., vol. 86, no. 11, pp. 6590-6592, Dec. 1999.