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Bias and thermal annealings of radiation-induced leakage currents in thin gate oxides
Journal
IEEE Trans. Nucl. Sci.
Author
C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho
Year
2000
Date
Dec. 2000.

C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho, "Bias and thermal annealings of radiation-induced leakage currents in thin gate oxides", IEEE Trans. Nucl. Sci., vol. 47, no. 6, pp. 2758-2764, Dec. 2000.