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Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
Journal
Solid-State Electron.
Author
C. H. Ang, C. H. Ling, B. J. Cho, S. J. Kim, and Z. Y. Cheng
Year
2000
Date
Nov. 2000.

C. H. Ang, C. H. Ling, B. J. Cho, S. J. Kim, and Z. Y. Cheng, "Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides", Solid-State Electron., vol. 44, no. 11, pp. 2001-2007, Nov. 2000.