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A comparative study of radiation-induced and stress-induced leakage currents in thin gate oxides
Journal
Semicond. Sci. Technol.
Author
C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho
Year
2000
Date
Oct. 2000.

C. H. Ang, C. H. Ling, Z. Y. Cheng, S. J. Kim, and B. J. Cho, "A comparative study of radiation-induced and stress-induced leakage currents in thin gate oxides", Semicond. Sci. Technol., vol. 15, no. 10, pp. 961-964, Oct. 2000.