Journals

  • Home
  • Publication
  • Journals
Correlation between direct tunneling leakage current degradation and interface traps in ultrathin silicon dioxides
Journal
Appl. Phys. Lett.
Author
W. Y. Loh, B. J. Cho, and M. F. Li
Year
2002
Date
Jul. 2002.

W. Y. Loh, B. J. Cho, and M. F. Li, "Correlation between direct tunneling leakage current degradation and interface traps in ultrathin silicon dioxides", Appl. Phys. Lett., vol. 81, no. 2, pp. 379-381, Jul. 2002.