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Evolution of quasi-breakdown mechanism in thin gate oxides
Journal
J. Appl. Phys.
Author
W. Y. Loh, B. J. Cho, and M. F. Li
Year
2002
Date
Apr. 2002.

W. Y. Loh, B. J. Cho, and M. F. Li, "Evolution of quasi-breakdown mechanism in thin gate oxides", J. Appl. Phys., vol. 91, no. 8, pp. 5302-5306, Apr. 2002.