Negative bias temperature instability on plasma-nitrided silicon dioxide film
- Journal
- Jpn. J. Appl. Phys.
- Year
- 2002
C. H. Ang, C. M. Lek, S. S. Tan, B. J. Cho, T. Chen, W. Lin, and J. Z. Zhen, "Negative bias temperature instability on plasma-nitrided silicon dioxide film", Jpn. J. Appl. Phys., vol. 41, no. 3B, pp. L314-L316, Mar. 2002.
