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Thermal instability of effective work function in metal/high-K stack and its material dependence
Journal
IEEE Electron Device Lett.
Author
M. S. Joo, B. J. Cho, N. Balasubramanian, and D. L. Kwong
Year
2004
Date
Nov. 2004.

M. S. Joo, B. J. Cho, N. Balasubramanian, and D. L. Kwong, "Thermal instability of effective work function in metal/high-K stack and its material dependence," IEEE Electron Device Lett., vol. 25, no. 11, pp. 716-718, Nov. 2004.