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Dark-current suppression in metal-germanium-metal photodetectors through dopant-segregation in NiGe-Schottky Barrier
Journal
IEEE Electron Device Lett.
Author
H. Zang, S. J. Lee, W. Y. Loh, J. Wang, K. T. Chua, M. B. Yu, B. J. Cho, G. Q. Lo, and D. L. Kwong
Year
2008
Date
Feb. 2008.

H. Zang, S. J. Lee, W. Y. Loh, J. Wang, K. T. Chua, M. B. Yu, B. J. Cho, G. Q. Lo, and D. L. Kwong, “Dark-current suppression in metal-germanium-metal photodetectors through dopant-segregation in NiGe-Schottky Barrier”, IEEE Electron Device Lett., vol. 29, no. 2, pp. 161-164, Feb. 2008.