Improvement of Data Retention and Erase Speed using Cubic-Structured HfO2 for Charge-trap type flash memory device
- Year
- 2010
- Author
- J.K. Park, Y.M. Park, M.H. Song, S.K. Lim, J.S. Oh, M.S. Joo, K, Hong and B.J. Cho
- Conference
- 17th Korean Conference on Semiconductors
J.K. Park, Y.M. Park, M.H. Song, S.K. Lim, J.S. Oh, M.S. Joo, K, Hong and B.J. Cho, "Improvement of Data Retention and Erase Speed using Cubic-Structured HfO2 for Charge-trap type flash memory device", 17th Korean Conference on Semiconductors, Daegu, Korea, Feb., 2010.
Feb, 2010.
Daegu, Korea