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Total 378건 17 페이지

2009
138

"Surface Passivation Using Silane for Epitaxial Growth of Graphene on SiC substrate" B.J.Kang, S.K.Lim, and B.J.Cho, 215th ECS Meeting, 2009
137

"Cubic Structured HfLaO Dielectrics for MIM Capacitor for RF IC Applications" L. Zhang, W. He, D. Chan, and B. Cho, 215th ECS Meeting, 2009
136

"Investigation of process dependence of graphene growth on nickel thin film" Jeong Hun Mun, Chanyong Hwang, Sung Kyu Lim, Byung Jin Cho, 56th AVS symposium, 2009
135

"Fatigue life of AL7075-R6 alloy with a circular hole-notch treated by optimum-peening intensity" Tae Hyung Kim, Byung Jin Cho, Seong Kyun Cheong, The Korean Society of Mechanical Engineers, 2009
2008
134

"Feasibility of Metal Carbides for Metal Gate CMOS Devices" B. J. Cho and W. S. Hwang, SEMI Technology Symposium 2008, 2008
133

"ALD of HfLaO and AlLaO for Flash Memory Device Application" B. J. Cho and W. He, The 4th Korean ALD Workshop, 2008
132

"SONOS Type Memory Cell with ALD LaAlO Blocking Oxide for High Speed Operation" W. He, D. S.H. Chan, and B. J. Cho, The 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008
131

"Electrical and Physical Properties of ALD HfLaO for CMOS Device Application" W. He, S. -J. Kim, Y. -S. Kim, B. J. Cho,, Material Research Society 2008 Spring Meeting, Symposium H, 2008
130

"A Novel Floating Gate Engineering Technique for Improved Data Retention of Flash Memory Devices" J.Pu, Daniel S. H. Chan, and B. J. Cho, The 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008
129

"Gadolinium Oxide(Gd2O3) Blocking Layer for Fast Program and Erase Speed in SONOS-Type Flash Memory Devices" J.Pu, S.J.Kim, Y.S.Kim, and B.J.Cho, Symposium F- Materials Science and Technology for Nonvolatile Memories, 2008
128

"Band Offeset FinFET-Based URAM (Unified-RAM) Built on SiC for Multi-functioning NVM and Capacitorless 1T-DRAM" J.W.Han, S.W.Ryu, S.H.Kim, C.J.Kim, J.H.Ahn, S.J.Choi, K.J.Choi, B.J.Cho, J.S.Kim, K.H.Kim, G.S.Lee,J.S.Oh, M.H.Song, Y.C.Park, J.W.Kim, and Y.K.Choi,, 2008 Symposium on VLSI Technology, 2008
127

"Mechanisms Limiting EOT Scaling and Gate Leakage Currents of High-k/Metal Gate Stacks Directl on SiGe and a method to Enable sub-1nm EOT" J.Huang, P.D.Kirsch, J.Oh, S.H.Lee, J.Price, P.Majhi, H.R.Harris, D.C.Gilmer, D.Q.Kelly, P.Sivasubramani, G.Bersuker, D.Heh, C.Young, C.S.Park, Y.N.Tan, N.Goel, C.Park, P.Y.Hung, P.Lysaght, K.J.Choi, B.J.Cho, H.-H.Tseng, B.H.Lee, and R.Jammy, 2008 Symposium on VLSI Technology, 2008
126

"The effect of Ge composition and Si cap thickness on hot carrier reliability of Si/Si1-xGex/Si p-MOSFETs with high-K/metal gate" W.-Y.Loh, P.Majhi, S.-H.Lee,J.-W.Oh, B.Sassman, C.Young, G.Bersuker, B.J.Cho, C.-S.Park, C.-Y.Kang, P.Kirsch, B.-H.Lee, H.R.Harris, H.-H.Tseng, R.Jammy, 2008 Symposium on VLSI Technology, 2008
125

"“High-K Dielectrics for Charge Trap - type Flash Memory Application”," B. J. Cho, W. He, and J. Pu, 2008 Asia-Pacific Workshop on Fundamentals and Applications on Advanced Semiconductor Devices, 2008
124

"Energy Band Engineered Unified-RAM (URAM) for Multi-Functioning 1T-DRAM and NVM" Jin-Woo Han, Seong-Wan Ryu, Sungho Kim, Chung-Jin Kim, Jae-Hyuk Ahn, Sung-Jin Choi, Kyu Jin Choi, Byung Jin Cho, Jin Soo Kim, Kwang Hee Kim, Gi Sung Lee, Jae Sub Oh, Myong Ho Song, Yun Chang Park, Jeoung Woo Kim, and Yang-Kyu Choi,, 54th IEEE International Electron Device Meeting, 2008

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