“High-K Dielectrics for Charge Trap - type Flash Memory Application”,
- Year
- 2008
- Author
- B. J. Cho, W. He, and J. Pu
- Conference
- 2008 Asia-Pacific Workshop on Fundamentals and Applications on Advanced Semiconductor Devices
B. J. Cho, W. He, and J. Pu, “High-K Dielectrics for Charge Trap - type Flash Memory Application”, 2008 Asia-Pacific Workshop on Fundamentals and Applications on Advanced Semiconductor Devices, p. 37 - 41, Sapporo, Japan, Jul., 2008. (Invited).
Jul., 2008.
Sapporo, Japan