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Total 378건 23 페이지

2003
48

"Fully silicided NiSi and germanided NiGe dual gates on Al2O3/GOI MOSFETs." C. H. Huang, D. S. Yu, A. Chin, W. J. Chen, C. Zhu, M. F. Li, B. J. Cho, D. L.Kwong,, International Electron Device Meeting (IEDM), 2003
47

"Voltage and temperature dependence of capacitance of high-K hfO2 MIM capacitors: A unified understanding and prediction" C. Zhu, H. Hu, X. F. Yang, S. J. Kim, A. Chin, M. F. Li, B. J. Cho, D. L. Kwong, International Electron Device Meeting (IEDM), 2003
46

"High-performance ALD HfO2-Al2O3 laminate MIM capacitors for RF and mixed signal IC applications" H.Hu, S. J. Ding, H. F. Lim, C. Zhu, M. F. Li, S. J. Kim, X. F. Xu, J. H. Chen, Y. F. Yong, B. J. Cho, D. S. H. Chan, S. Rustagi, M. F. Yu, C. H. Tung, A. Y. Du, P. D. Foo, A. Chin, D. L. Kwong,, International Electron Device Meeting (IEDM), 2003
45

"Analysis of charge trapping and breakdown mechanism in high-K dielectrics with metal gate electrode using carrier separation" W. Y. Loh, B. J. Cho, M. S. Joo, M. F. Li, D. S. H. Chan, D. L. Kwong, International Electron Device Meeting (IEDM), 2003
2002
44

"Electrical Properties of CMOS Devices with Cu Local Interconnects" H.Xie, W. J. Yoo, C. Zhu, S. Y. Lim, D. Tan, B. J. Cho, and D. Lai, 8th International Conference on Dielectrics & Conductors for ULSI Multilevel Interconnection (DCMIC), 2002
43

"Characterization of Ultrathin Plasma Nitrided Gate Dielectrics in PMOSFET for 0.18μm Technology and Beyond" S. S. Tan, C. H. Ang, C. M. Lek, T. Chen, B. J. Cho, A. See and L. Chan, 9th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2002
42

"Correlation between interface traps and gate laeakage in ultra-thin silicon dioxide (20A)" W. Y. Loh, B. J. Cho, M. F. Li, C. M. Lek, Y. F. Yong and M. S. Joo, 9th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2002
41

"Effects of Post-Decoupled-Plasma-Nitridation Annealing of Ultra-Thin Gate Oxide" C. M. Lek , B. J. Cho, W. Y. Loh, C. H. Ang, W. Lin, Y. L. Tan, J. Z. Zhen, J. Tan, T. P. Chen, Proc. of 9th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2002
40

"Investigation of (HfO2)x(Al2O3)1-x on (100) Si by XPS - energy gap and band alignment" H. Y. Yu, M. F. Li, D. L. Kwong, B. J. Cho, J. S. Pan, C. H. Ang, and J. Z. Zheng, Extended Abstract of the 2002 International Conf. on Solid State Devices and Materials (SSDM),, 2002
39

"Advanced laser applications in microelectronics and data storage devices" YF Lu, WD Song, ZM Ren, CW An, DM Liu, WJ Wang, BJ Cho, JN Zeng, CF Tan, ICALEO 2002 - 21st International Congress on Applications of Laser and Electro-Optics, Congress Proceedings, 2002
38

"Laser microprocessing in microelectronics, data storage, and photonics" Yongfeng Lu, Wen D Song, ZhongMin Ren, Chengwu An, DaMing Liu, Sumei Huang, Weijie Wang, Ming Hui Hong, Tow Chong Chong, BJ Cho, JiNan Zeng, CF Tan, International Symposium on High-Power Laser Ablation 2002, pp211-222, 2002
2001
37

"Effect of electron-beam lithography on thin gate oxide reliability" P. F. Chong, B. J. Cho, E. F. Chor, and M. S. Joo, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2001
36

"Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides" W. Y. Loh, B. J. Cho, M. F. Li, and Z. Xu, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2001
35

"Effects of Cu diffusion on MOSFET electrical properties" C. Zhu, W. J. Yoo, D. P. P. Tan, S. Y. Lim, and B. J. Cho,, 18th InternationalVLSI Multilevel Interconnection Conf. (VMIC), 2001
34

"Comparison Study between Stepper and Scanner for gate CD Control Using Total Process-Proximity-based Correction" Byung-Ho Nam, Dong-Seok Kim, Byung-Jin Cho, Nam-Ki Seok, Jae K Jeong, Sang-Pye Kim, Sang-Woo Kang, Young J Hwang, Young Jin Song, Photomask Technology, pp793-800, 2001

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