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Anti-Ferroelectric HZO Blocking Layer in Charge Trap Flash Memory Device (Invited Talk) 
Year
2021 
Author
Sung Won Shin 
Co-author
Eui Joong Shin, and Byung Jin Cho 
Conference
International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY Technical Program, Invited talk 
Sung Won Shin, Eui Joong Shin, and Byung Jin Cho, "Anti-Ferroelectric HZO Blocking Layer in Charge Trap Flash Memory Device", 2021 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY Technical Program, Invited talk, November 14-16, 2021. (On-line Virtual)