Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors
- Year
- 2017
- Author
- Jae Hoon Bong, Seung-Yoon Kim, Chan Bae Jeong, Ki Soo Chang, Wan Sik Hwang and Byung Jin Cho
- Conference
- 48th IEEE Semiconductor Interface Specialists Conference
Jae Hoon Bong, Seung-Yoon Kim, Chan Bae Jeong, Ki Soo Chang, Wan Sik Hwang and Byung Jin Cho, "Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors", 48th IEEE Semiconductor Interface Specialists Conference, San Diego, United States, December 6-9, 2017
December 6-9, 2017
San Diego, United States