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Total 5건 1 페이지

1994
5

"New breakdown mechanism of ultra thin gate oxides under ballistic transport" S. H. Lee, M. S. Joo, B. J. Cho, Y. J. Park, and J. C. Kim, 1st Korean Semiconductor Tech. Symp., pp. 179, 1994
4

"Effect of in-situ P doped polysilicon on gate oxide (II) - Process condition dependence" J. U. Lim, B. J. Cho, Y. J. Park, J. C. Kim, and S. H. Choi, 41st Spring Meeting of the Japan Society of Applied Physics and Related Societies, 1994
3

"Effect of in-situ P doped polysilicon on gate oxide (I) - yield degradation" J. U. Lim, B. J. Cho, Y. J. Park, J. C. Kim, and S. H. Choi, 41st Spring Meeting of the Japan Society of Applied Physics and Related Societies, 1994
2

"Very light nitridation of thin gate oxide in low pressure N2O" M. S. Joo, S. H. Lee, B. J. Cho, J. C. Kim, and S. H. Choi, 3rd Symp. on Silicon Nitride and Silicon Dioxide Thin Insulation Films, 1994
1

"Quasi-breakdown of ultra thin gate oxide under high field stress" S. H. Lee, B. J. Cho, J. C. Kim, and S. H. Choi, IEEE International Electron Devices Meeting (IEDM) Technical Digest, 1994

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