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Total 9건 1 페이지

1999
9

"Design of lateral OGBT protection circuit for smart power integration" J. Y. Luo, Y. C. Liang, and B. J. Cho, 1999 International Conf. on Power Electronics and Drive System,, 1999
8

"Radiation -induced leakage current of ultra-thin gate oxide under X-ray lithography condictions" B. J. Cho, S. J. Kim, C. H. Ling, M. S. Joo, and I. S. Yeo, 7th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 1999
7

"A study of quasi-breakdown mechanism in ultra-thin gate oxide by using DCIV technique" H. Guan, B. J. Cho, M. F. Li, Y. D. He, Z. Xu, and Z. Dong, 7th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), 1999
6

"Channel-width effect on hot-carrier degradation in NMOSFETs with recessed-LOCOS isolation structure" J. M. P. Yue, W. K. Chim, B. J. Cho, W. H. Qin, D. S. H. Chan, Y. B. Kim, S. A. Jang, and I. S. Yeo,, 7th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 94, IEEE, 1999
5

"Integrity of gate oxides irradiated under electron-beam lithography conditions" P. F. Chong, B. J. Cho, E. F. Chor, M. S. Joo, and I. S. Yeo, 1999 International Conf. on Solid State Devices and Materials (SSDM), 1999
4

"Predicting plasma charging damage in ultra thin gate oxide by using nondestructive DCIV technique" H. Guan, M. F. Li, Y. Zhang, B. J. Cho, B. B. Jie, J. Xie, J. L. F. Wang, A. C. Yen, G. T. T. Sheng, Z. Dong, and W. Li, 1999 IEEE International Integrated Reliability Workshop (IRW) Final Report, 1999
3

"A study of quasi-breakdown mechanism in ultra thin gate oxide under various types of stress" H. Guan, Z. Xu, B. J. Cho, M. F. Li, and Y. D. He,, Materials Research Society (MRS) 1999 Fall Meeting Symp, 1999
2

"Roles of primary hothole and FN electron fluences in gate oxide breakdown" M. F. Li, Y. D. He, S. G. Ma, B. J. Cho, K. F. Lo, and M. Z. Xu, Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc, 1999
1

"Investigation of quasi-breakdown mechanism in ultrathin gate oxides" Y. D. He, H. Guan, M. F. Li, B. J. Cho, and Z. Dong, Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc, 1999

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