Roles of primary hothole and FN electron fluences in gate oxide breakdown
- Year
- 1999
- Author
- M. F. Li, Y. D. He, S. G. Ma, B. J. Cho, K. F. Lo, and M. Z. Xu
- Conference
- Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc
M. F. Li, Y. D. He, S. G. Ma, B. J. Cho, K. F. Lo, and M. Z. Xu, "Roles of primary hothole and FN electron fluences in gate oxide breakdown", Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc., New Hampshire, USA, Nov. 1999.
Nov. 1999.
New Hampshire, USA