Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides
- Year
- 2001
- Author
- W. Y. Loh, B. J. Cho, M. F. Li, and Z. Xu
- Conference
- 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA)
W. Y. Loh, B. J. Cho, M. F. Li, and Z. Xu, "Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides", Proc. of the 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), p. 59, IEEE, Singapore, July 2001.
July 2001.
Singapore