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Substituted Aluminum Metal Gate on high-K Dielectric for low work-function and Fermi-Level Pinning Free 
Year
2004 
Author
C. S. Park, B. J. Cho, L. J. Tang, and D. L. Kwong 
Conference
International Electron Device Meeting (IEDM) 

C. S. Park, B. J. Cho, L. J. Tang, and D. L. Kwong, "Substituted Aluminum Metal Gate on high-K Dielectric for low work-function and Fermi-Level Pinning Free", International Electron Device Meeting (IEDM), December 2004, San Francisco, USA.


December 2004
San Francisco, USA.