Conference

  • Home
  • Publication
  • Conference
High Quality N+/P Junction of Ge Substrate Prepared by initiated CVD Doping Process 
Year
2020 
Author
Jae Hwan Kim, Sung Won Shin, Tae In Lee, Wan Sik Hwang, and Byung Jin Cho 
Conference
2020 Symposia on VLSI Technology and Circuits 
File
Jaehwan_VLSI_2020.png (226.1K) 0회 다운로드 DATE : 2020-06-16 10:10:18

Jae Hwan Kim, Sung Won Shin, Tae In Lee, Wan Sik Hwang, and Byung Jin Cho, "High Quality N+/P Junction of Ge Substrate Prepared by initiated CVD Doping Process," 2020 Symposia on VLSI Technology and Circuits, Hawaii, USA, July. 2020. 

Jaehwan_VLSI_2020.png



July. 2020.
Hawaii, USA