Proposal of Block Erase and Verify Schemes for Ferroelectric NAND: Overcoming Critical Challenges from Threshold Voltage Polarity 

Year

2025 

Author

Song-Hyeon Kuk, Bong Ho Kim, Youngkeun Park, Hyeon-Seong Hwang, Jae-Hoon Han, Byung Jin Cho, Byung Chul Jang and Sang-Hyeon Kim 

Conference

2025 IEEE International Memory Workshop