Hidden Domain-State Engineering for Pass-Disturb Suppression in FeFET-Based 3D NAND Flash Memory  

Year

2026 

Author

Sheung Hun Kim  

Co-author

Yungjun Kim, Dae Hyun Kang, Youngkeun Park, Dongkyu Lee, and Byung Jin Cho  

Conference

2026 International Electron Devices Meeting (IEDM)