High-temperature structure for measuring properties of curved thermoelectric device, and system and method for measuring properties of curved thermoelectric device using the same

Inventor

S. H. Park, C. Y. Yoo, H. S. Kim, M. S. Suh, D. K. Kim, and B. J. Cho

No.

15219429

출원국가

국외

Date

2016

Date

Jul. 2016.