HIGH TEMPERATURE STRUCTURE FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE, SYSTEM FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE USING THE SAME AND METHOD THEREOF
- Inventor
- S. H. Park, C. Y. Yoo, H. S. Kim, M. S. Seo, D. K. Kim, B. J. Cho
- No.
- 10-2016-0172455
- 출원국가
- 국내
- Date
- 2016
HIGH TEMPERATURE STRUCTURE FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE, SYSTEM FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE USING THE SAME AND METHOD THEREOF (Patent pending)